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High resolution optical frequency domain reflectometry for characterization of components and assemblies

โœ Scribed by Soller, Brian J.; Gifford, Dawn K.; Wolfe, Matthew S.; Froggatt, Mark E.


Book ID
115404707
Publisher
Optical Society of America
Year
2005
Tongue
English
Weight
145 KB
Volume
13
Category
Article
ISSN
1094-4087

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