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High resolution hydrogen profiling in superconducting materials by ion beam analysis (ERD-EXB)

✍ Scribed by B Roux; A Chevarier; N Chevarier; B Wybourn; C Antoine; B Bonin; P Bosland; S Cantacuzene


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
505 KB
Volume
46
Category
Article
ISSN
0042-207X

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