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High-resolution Fourier-transform IR spectroscopic determination of impurities in silicon tetrafluoride and silane prepared from it

✍ Scribed by L. A. Chuprov; P. G. Sennikov; K. G. Tokhadze; S. K. Ignatov; O. Schrems


Book ID
110165778
Publisher
SP MAIK Nauka/Interperiodica
Year
2006
Tongue
English
Weight
230 KB
Volume
42
Category
Article
ISSN
0020-1685

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