✦ LIBER ✦
High-Reliability Trigate Poly-Si Channel Flash Memory Cell With Si-Nanocrystal Embedded Charge-Trapping Layer
✍ Scribed by Hung-Bin Chen; Yung-Chun Wu; Lun-Chun Chen; Ji-Hong Chiang; Chao-Kan Yang; Chun-Yen Chang
- Book ID
- 114572659
- Publisher
- IEEE
- Year
- 2012
- Tongue
- English
- Weight
- 409 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0741-3106
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