✦ LIBER ✦
High reliability screening of semiconductor and integrated circuit devices : J. Lombardi, L. McDonough and H. Padden, Washington, NASA, April 1967, 161 p. Refs. (Contract NAS5-9639) (NASA-CR-721: N67-23322) Avail: CFSTI
- Publisher
- Elsevier Science
- Year
- 1969
- Tongue
- English
- Weight
- 90 KB
- Volume
- 8
- Category
- Article
- ISSN
- 0026-2714
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