High reliability in PHEMT MMICs with dual-etch-stop AlAs layers for high-speed RF switch applications

✍ Scribed by Frank Gao

• Book ID: 108361963
• Publisher: Elsevier Science
• Year: 2003
• Tongue: English
• Weight: 562 KB
• Volume: 43
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/s0026-2714(03)00067-2