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High quality resonances for terahertz radiation diffraction at periodically corrugated semiconductor interfaces

✍ Scribed by I. S. Spevak; M. A. Timchenko; V. K. Gavrikov; V. M. Shulga; J. Feng; H. B. Sun; A. V. Kats


Publisher
Springer
Year
2011
Tongue
English
Weight
429 KB
Volume
104
Category
Article
ISSN
0721-7269

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