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High-pressure X-ray near-edge absorption study of thallium rhenium oxide up to 10.86 GPa

✍ Scribed by Ablett, J. M.; Kao, C. C.; Shieh, S. R.; Mao, H.-K.; Croft, M.; Tyson, T. A.

Book ID: 126694838
Publisher: Taylor and Francis Group
Year: 2003
Tongue: English
Weight: 130 KB
Volume: 23
Category: Article
ISSN: 0895-7959
DOI: 10.1080/08957950310001615839

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