๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

High-pressure x-ray diffraction and Raman spectra study of indium oxide

โœ Scribed by Liu, D.; Lei, W. W.; Zou, B.; Yu, S. D.; Hao, J.; Wang, K.; Liu, B. B.; Cui, Q. L.; Zou, G. T.

Book ID
115540746
Publisher
American Institute of Physics
Year
2008
Tongue
English
Weight
806 KB
Volume
104
Category
Article
ISSN
0021-8979

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

X-ray diffraction and high-pressure Rama
X-ray diffraction and high-pressure Raman scattering study of iodine-intercalated Bi2Sr2CaCu2O8+x
โœ C.H. Qiu; S.P. Ahrenkiel; N. Wada; T.F. Ciszek ๐Ÿ“‚ Article ๐Ÿ“… 1991 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 173 KB

Single-crystal, stage-1 IBi2Sr2CaCu2Os+ x was synthes~zext. X-ray diffraction patterns indicate that upon intercalation, the c-axis correlation length decrea.,,,s substantially, but the in-plane host layer structure appears to remain unchanged. The compounds exhibit resonance Raman scattering. Raman

High-pressure X-ray diffraction study of
High-pressure X-ray diffraction study of InAs
โœ G. Aquilanti; W.A. Crichton; T. Le Bihan; S. Pascarelli ๐Ÿ“‚ Article ๐Ÿ“… 2003 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 354 KB