High-precision methods and devices for in situ measurements of thermally induced aberrations in optical elements

✍ Scribed by Zelenogorsky, Victor V. ;Solovyov, Alexander A. ;Kozhevatov, Ilya E. ;Kamenetsky, Eugene E. ;Rudenchik, Eugene A. ;Palashov, Oleg V. ;Silin, Dmitry E. ;Khazanov, Efim A.

• Book ID: 115352868
• Publisher: The Optical Society
• Year: 2006
• Tongue: English
• Weight: 742 KB
• Volume: 45
• Category: Article
• ISSN: 1559-128X
• DOI: 10.1364/AO.45.004092