High Precision Measurement of Transistor Noise with Automatic Calibration under Computer Control

✍ Scribed by Cox, C. E.; Kandiah, K.

• Book ID: 114662970
• Publisher: IEEE
• Year: 1984
• Tongue: English
• Weight: 908 KB
• Volume: 31
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.1984.4333300