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High Growth Rate of Erbium Oxide Thin Films in Atomic Layer Deposition from (CpMe)3Er and Water Precursors

✍ Scribed by J. Päiväsaari; J. Niinistö; K. Arstila; K. Kukli; M. Putkonen; L. Niinistö


Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
327 KB
Volume
11
Category
Article
ISSN
0948-1907

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