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High- Gate Stack Properties in SON Transistor Given by Voltage and Temperature Dependence of Random Telegraph Signal

✍ Scribed by Trabelsi, M.; Militaru, L.; Savio, A.; Monfray, S.; Souifi, A.


Book ID
114620462
Publisher
IEEE
Year
2011
Tongue
English
Weight
452 KB
Volume
58
Category
Article
ISSN
0018-9383

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