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High Frequency Probing of Nanometric Resolution Using Near-Field Optical Heterodyne Technology

✍ Scribed by Ali, Mohammed E.; Fetterman, Harold R.; Han, Seok K.; Kang, Kwang Y.

Book ID: 115436731
Publisher: Optical Society of America
Year: 1999
Tongue: English
Weight: 213 KB
Volume: 10
Category: Article
ISSN: 1047-6938
DOI: 10.1364/OPN.10.12.000023

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