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High-frequency FET noise parameters and approximation of the optimum source admittance

✍ Scribed by Leupp, A.; Strutt, M.J.O.

Book ID: 114589687
Publisher: IEEE
Year: 1969
Tongue: English
Weight: 359 KB
Volume: 16
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1969.16772

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