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High-frequency EPR and ENDOR spectroscopy on semiconductor nanocrystals

✍ Scribed by S. B. Orlinskii; H. Blok; E. J. J. Groenen; J. Schmidt; P. G. Baranov; C. de Mello Donegá; A. Meijerink

Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
315 KB
Volume
43
Category
Article
ISSN
0749-1581

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