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High energy X-ray diffraction analysis of strain and residual stress in silicon nitride ceramic diffusion bonds

โœ Scribed by M. Vila; C. Prieto; P. Miranzo; M.I. Osendi; A.E. Terry; G.B.M. Vaughan

Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
151 KB
Volume
238
Category
Article
ISSN
0168-583X

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