✦ LIBER ✦
High-energy tail electrons as the mechanism for the worst-case hot-carrier stress degradation of the deep submicrometer N-MOSFET
✍ Scribed by D. Ang; T. Phua; H. Liao; C. Ling
- Book ID
- 124154116
- Publisher
- IEEE
- Year
- 2003
- Tongue
- English
- Weight
- 248 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0741-3106
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