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High energy proton damage effects in thin high resistivity FZ silicon detectors

✍ Scribed by E. Fretwurst; L. Andricek; F. Hönniger; G. Kramberger; G. Lindström; G. Lutz; M. Reiche; R.H. Richter; A. Schramm

Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 264 KB
Volume: 552
Category: Article
ISSN: 0168-9002
DOI: 10.1016/j.nima.2005.06.019

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