✦ LIBER ✦
High-energy-ion-induced damages at metal-silicon interfaces during channeling measurements
✍ Scribed by Jong Moon; Toshimichi Ito; Akio Hiraki
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 232 KB
- Volume
- 56-58
- Category
- Article
- ISSN
- 0169-4332
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