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High energy ion implantation for C-MOS isolation n-wells technology: Problems related to the use of multicharged phosphorous ions in an industrial context

✍ Scribed by P. Spinelli; J. Escaron; A. Soubie; M. Bruel


Book ID
113277342
Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
467 KB
Volume
6
Category
Article
ISSN
0168-583X

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