High-energy heavy ion testing of VLSI devices for single event upsets and latch up

✍ Scribed by S. B. Umesh; S. R. Kulkarni; R. Sandhya; G. R. Joshi; R. Damle; M. Ravindra

• Book ID: 110646971
• Publisher: Springer-Verlag
• Year: 2005
• Tongue: English
• Weight: 34 KB
• Volume: 28
• Category: Article
• ISSN: 0250-4707
• DOI: 10.1007/bf02711239