๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

High-Efficient and Reliable Broad-Area Laser Diodes With a Window Structure

โœ Scribed by Morita, T.; Nagakura, T.; Torii, K.; Takauji, M.; Maeda, J.; Miyamoto, M.; Miyajima, H.; Yoshida, H.

Book ID
120318509
Publisher
IEEE
Year
2013
Tongue
English
Weight
437 KB
Volume
19
Category
Article
ISSN
1077-260X

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Materials and Reliability Handbook for S
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices || Catastrophic Optical Damage in High-Power, Broad-Area Laser Diodes
โœ Ueda, Osamu; Pearton, Stephen J. ๐Ÿ“‚ Article ๐Ÿ“… 2012 ๐Ÿ› Springer New York ๐ŸŒ English โš– 754 KB

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and