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High-Density Large-Area-Array Interconnects Formed by Low-Temperature Cu/Sn–Cu Bonding for Three-Dimensional Integrated Circuits

✍ Scribed by Lueck, M.R.; Reed, J.D.; Gregory, C.W.; Huffman, A.; Lannon, J.M.; Temple, D.S.


Book ID
114620978
Publisher
IEEE
Year
2012
Tongue
English
Weight
710 KB
Volume
59
Category
Article
ISSN
0018-9383

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