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High-Density Carrier Accumulation in ZnO Field-Effect Transistors Gated by Electric Double Layers of Ionic Liquids

✍ Scribed by Hongtao Yuan; Hidekazu Shimotani; Atsushi Tsukazaki; Akira Ohtomo; Masashi Kawasaki; Yoshihiro Iwasa


Publisher
John Wiley and Sons
Year
2009
Tongue
English
Weight
650 KB
Volume
19
Category
Article
ISSN
1616-301X

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