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Hg0.7Cd0.3Te/SiO2-Photox interface properties studied by photo- and bias-induced charging

โœ Scribed by A. Ksendzov; Fred H. Pollak; J.A. Wilson; V.A. Cotton


Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
457 KB
Volume
86
Category
Article
ISSN
0022-0248

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