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"He's Guilty!": Investigator Bias in Judgments of Truth and Deception

✍ Scribed by Christian A. Meissner and Saul M. Kassin


Book ID
124934292
Publisher
Springer
Year
2002
Tongue
English
Weight
317 KB
Volume
26
Category
Article
ISSN
0147-7307

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In the present work we analyze the performance of power pseudomorphic HEMT's having scaled gate widths (300, 600, 900 mm) under a wide range of bias and temperature conditions to investigate the onset of an hot electron regime. These devices exhibit a negative slope of I D with respect to V DS and a