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Healing of voids in the aluminum metallization of integrated circuit chips : Edward F. Cuddihy, Russel A. Lawton and Thomas R. Gavin. IEEE Trans. Reliab.39(5), 564 (1990)


Book ID
103287583
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
129 KB
Volume
31
Category
Article
ISSN
0026-2714

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