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[Hartung-Gorre Verlag ISPSD'94 International Symposium on Power Semiconductor Devices and IC's - Davos, Switzerland (31 May-2 June 1994)] Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics - A study on the variation of carrier lifetime with temperature in bipolar silicon devices and its influence on device operation

✍ Scribed by Gerstenmaief, Y.C.

Book ID: 126594753
Publisher: Hartung-Gorre Verlag
Year: 1994
Weight: 371 KB
Category: Article
ISBN-13: 9783891917848
DOI: 10.1109/ISPSD.1994.583738

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