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Harsh environment application of electronics – Reliability of copper wiring and testability thereof

✍ Scribed by S. Rathgeber; R. Bauer; A. Otto; E. Peter; J. Wilde

Book ID: 119326710
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 988 KB
Volume: 52
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2012.06.083

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