Hardware design and VLSI implementation of a byte-wise CRC generator chip

[IEEE Computer Soc 18th International Co

[IEEE Computer Soc 18th International Conference on VLSI Design - Kolkata, India (3-7 Jan. 2005)] 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design - A universal random test generator for functional verification of microprocessors and system-on-chip

✍ Uday Bhaskar, K.; Prasanth, M.; Chandramouli, G.; Kamakoti, V. 📂 Article 📅 2005 🏛 IEEE Computer Soc 🌐 English ⚖ 194 KB

A January 2005 conference fostered interaction between the domains of system architecture, logic and circuit design, and device fabrication. Design automation, embedded systems design, rapid prototyping, and embedded software design were some other themes. Papers from the conference focus on power-a