Hard photon yields from (70–240) GeV electrons incident near axial directions on Si, Ge and W single crystals with a large thickness variation

✍ Scribed by R. Medenwaldt; S.P. Møller; S. Tang-Petersen; E. Uggerhøj; K. Elsener; M. Hage-Ali; P. Siffert; J. Stoquert; P. Sona; K. Maier

• Book ID: 113358339
• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 357 KB
• Volume: 242
• Category: Article
• ISSN: 0370-2693
• DOI: 10.1016/0370-2693(90)91805-l