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Handling the pin overhead problem of DFTs for high-quality and at-speed tests

✍ Scribed by Dong Xiang; Fujiwara, H.

Book ID: 118698291
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 322 KB
Volume: 21
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2002.801099

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