A novel approach for the determination of the incidence angle in a magnetic-sector SIMS instrument is described. It is based on accurate mapping of the primary beam in the extraction รeld near the sample surface. The accuracy of the method and the applicability of simple formulas are discussed in de
โฆ LIBER โฆ
Gyrokinetic Approach to the Analysis of Incident Angle Distribution of Ions in a Magnetized Sheath
โ Scribed by G. Kawamura; A. Fukuyama
- Publisher
- John Wiley and Sons
- Year
- 2008
- Tongue
- English
- Weight
- 126 KB
- Volume
- 48
- Category
- Article
- ISSN
- 0005-8025
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