Guest Editors' Introduction: System IC Design Challenges beyond 32 nm

✍ Scribed by Joyner Jr., William H.; Yeh, David C.

• Book ID: 119807566
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 198 KB
• Volume: 25
• Category: Article
• ISSN: 0740-7475
• DOI: 10.1109/mdt.2008.95