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Growth of Polycrystalline Cd0.8Zn0.2Te Thick Films for X-Ray Detectors

✍ Scribed by J.S. Kwon; D.Y. Shin; I.S. Choi; H.S. Kim; K.H. Kim; S.U. Kim; M.J. Park

Publisher: John Wiley and Sons
Year: 2002
Tongue: English
Weight: 114 KB
Volume: 229
Category: Article
ISSN: 0370-1972
DOI: 10.1002/1521-3951(200201)229:2<1097::aid-pssb1097>3.0.co;2-c

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