Growth of Oxide Layers on Thin Aluminum Nitride Samples Measured by Electron Energy-Loss Spectroscopy

✍ Scribed by Martin Sternitzke

• Book ID: 110826450
• Publisher: John Wiley and Sons
• Year: 1993
• Tongue: English
• Weight: 581 KB
• Volume: 76
• Category: Article
• ISSN: 0002-7820
• DOI: 10.1111/j.1151-2916.1993.tb07766.x