✦ LIBER ✦
Growth of low and high refractive index dielectric layers as studied by in situ ellipsometry
✍ Scribed by V. Nguyen Van; S. Fisson; J.M. Frigerio; J. Rivory; G. Vuye; Y. Wang; F. Abelès
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 460 KB
- Volume
- 253
- Category
- Article
- ISSN
- 0040-6090
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