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Growth mode and structural characterization of epitaxial TM/RE thin films

✍ Scribed by P. Pankowski; S. Pizzini; J.B. Pelka; A. Wawro; L.T. Baczewski

Book ID: 117622115
Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 191 KB
Volume: 362
Category: Article
ISSN: 0925-8388
DOI: 10.1016/s0925-8388(03)00562-0

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