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Growth-induced interface roughness of GaAs/AlAs-layers studied by X-ray scattering under grazing angles

✍ Scribed by U. Klemradt; M. Funke; M. Fromm; B. Lengeler; J. Peisl; A. Förster

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 525 KB
Volume: 221
Category: Article
ISSN: 0921-4526
DOI: 10.1016/0921-4526(95)00901-9

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