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Growth behavior of fine grains formed by diffusion induced recrystallization in the Cu(Zn) system

✍ Scribed by N. Goukon; T. Ikeda; M. Kajihara


Book ID
108490673
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
744 KB
Volume
48
Category
Article
ISSN
1359-6454

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✍ Y. Yamamoto; M. Kajihara 📂 Article 📅 1999 🏛 Elsevier Science 🌐 English ⚖ 224 KB

AbstractÐDiusion induced grain boundary migration (DIGM) in the Cu(Zn) system was experimentally studied by Li and Hillert using polycrystalline Cu specimens zinci®ed with binary Cu±Zn alloys containing 3.9±30.5 wt% of Zn at temperatures between 573 and 773 K. Their experimental results have been qu