Growth and physicochemical characterization of CuAlTe2 films obtained by reaction, induced by annealing, between Cu/Al/Te/Al/Cu... Al/Cu/Al/Te layers sequentially deposited

✍ Scribed by K. Benchouk; C. El Moctar; J. C. Bernede; S. Marsillac; J. Pouzet; N. Barreau; M. Emziane

• Book ID: 111535134
• Publisher: Springer
• Year: 1999
• Tongue: English
• Weight: 83 KB
• Volume: 34
• Category: Article
• ISSN: 0022-2461
• DOI: 10.1023/a:1004575612586