✦ LIBER ✦
Growth and in-depth distribution of thin metal films on silicon (111) studied by XPS: inelastic peak shape analysis
✍ Scribed by M. Schleberger; D. Fujita; C. Scharfschwerdt; S. Tougaard
- Book ID
- 116067231
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 647 KB
- Volume
- 331-333
- Category
- Article
- ISSN
- 0039-6028
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