Growth and characterization of SnSe2

✍ Scribed by E. Trifonova; I. Y. Yanchev; P. Manou; K. Kambas; A. N. Anagnostopoulos

• Book ID: 104735987
• Publisher: Springer
• Year: 1996
• Tongue: English
• Weight: 742 KB
• Volume: 31
• Category: Article
• ISSN: 0022-2461
• DOI: 10.1007/bf00352773

✦ Synopsis

Tin diselenide single crystals were grown by direct synthesis using the Bridgman technique and were subsequently purified by successive recrystallizations. An X-ray powder diffraction study verified that the crystals obtained belong to the D3ad --P3ml space group with lattice parameters a = 0.3811 nm and c--0.6137 nm. A stoichiometric analysis gave a maximum deviation of their nominal SnSe2 composition of ~ 4%. Study of their morphology by scanning electron microscopy reveals the layered-type structure of the obtained material. Finally, the microhardness parallel and perpendicular to the layer planes was found to be strongly anisotropic, as expected from the layered structure of SnSe2.