Growth and characterization of Si1−xGex and Ge epilayers on (100) Si: J M Baribeau et al, J appl Phys, 63, 1988, 5738–5746

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 153 KB
• Volume: 39
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(89)90902-0