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Grazing incidence X-ray scattering from Ge/Si superlattices grown at low temperature

✍ Scribed by X.S Wu; T.P.A Hase; B.K Tanner; H.H Cheng

Book ID: 108278807
Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 447 KB
Volume: 548
Category: Article
ISSN: 0039-6028
DOI: 10.1016/j.susc.2003.11.015

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