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Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment

✍ Scribed by Neuschitzer, Markus ;Moser, Armin ;Neuhold, Alfred ;Kraxner, Johanna ;Stadlober, Barbara ;Oehzelt, Martin ;Salzmann, Ingo ;Resel, Roland ;Novák, Jiří

Book ID: 114497416
Publisher: International Union of Crystallography
Year: 2012
Tongue: English
Weight: 640 KB
Volume: 45
Category: Article
ISSN: 0021-8898
DOI: 10.1107/s0021889812000908

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## Abstract As a precursor material for electrooptical applications in the integrated optics, nominal pure as well as Zn‐doped stoichiometric LiNbO~3~ thin films of a few µm thickness were grown by liquid phase epitaxy on congruent LiNbO~3~ substrates. The crystalline perfection and lattice paramet