Grain Growth Behavior during Static Recrystallization of 3%-Silicon Steel Following High Temperature Deformation

✍ Scribed by Muraki, Mineo; Ozaki, Y.; Hisata, M.; Obara, T.; Kan, T.

• Book ID: 120946104
• Publisher: Trans Tech Publications, Ltd.
• Year: 1996
• Tongue: English
• Weight: 544 KB
• Volume: 204-206
• Category: Article
• ISSN: 1662-9752
• DOI: 10.4028/www.scientific.net/MSF.204-206.533