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Goodness-of-Fit Tests for Parametric Models Based on Biased Samples

✍ Scribed by Yanqing Sun, Sufang Cui and Ram C. Tiwari

Book ID: 111851096
Publisher: John Wiley and Sons
Year: 2002
Tongue: French
Weight: 975 KB
Volume: 30
Category: Article
ISSN: 0319-5724
DOI: 10.2307/3316149

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