Ellipsometry and Infrared Reflection Abs
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Christopher B. Walsh; Xinyun Wen; Elias I. Franses
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Article
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2001
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Elsevier Science
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English
β 163 KB
Optical techniques play an increasingly important role in the characterization of microstructure and surface densities of thin films at various interfaces. In this study, ellipsometry and infrared reflection absorption spectroscopy (IRRAS) were used for determining the surface densities of adsorbed